Magnetic Properties and MFM Observation of Co-Cr-Ta and Co-Cr Thin Films with Perpendicular Magnetic Anisotropy.

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  • ISHIO S.
    Department of Materials Engineering and Applied Che. mistry, Akita University
  • OKAMOTO T.
  • ABE H.
    Department of Materials Engineering and Applied Che. mistry, Akita University
  • SAITO H.
    Department of Materials Engineering and Applied Che. mistry, Akita University
  • OUCHI K.
    Akita Research Institute of Advanced Technology

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Other Title
  • Ｃｏ‐Ｃｒ‐Ｔａ並びにＣｏ‐Ｃｒ垂直磁化膜の磁化特性とＭＦＭ観察
  • Co Cr Ta ナラビニ Co Cr スイチョク ジカ マク ノ ジカ トク

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Abstract

Magnetic properties and domain structures have been investigated for CO80Cr16 Ta4 and CO80 Cr20 films with perpendicular magnetic anisotropy. MFMobservation for the remanent magnetization state shows a bright-dark contrastwith a mean wave length of 0.4-0.6μm for the films prepared at the substratetemperature Ts>500K and a maize type domain pattern for the films preparedat room temperature. The magnetization process is understood as the domainwall movement for the films with Ts-300K and the irreversible rotation ofmagnetization of single domain particles for the films with Ts>500K. Therelation between the bright-dark contrast observed by MFM and the magneticmicrostructure is discussed.

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