書誌事項
- タイトル別名
-
- Treatment and X-ray reflection intensity of solution-grown ADP crystal
- リンサン ニスイソ アンモニウム ADP ブンコウ ケッショウ ノ イクセイ オヨビ Xセン ハンシャ キョウド
この論文をさがす
説明
The analyzing crystals in fluorescent X-ray instrument were usually prepared by polishing them with cloths to give mosaic surface structure for raising the X-ray reflection intensity. The theoretical consideration {intensity formulae (1) and (2) and calculated values by their application on ADP crystal in Table 1} suggested however that by increasing the wavelengths of analytical lines the perfect crystal gave greater reflecting intensity than the mosaic crystal, and it was experimentally proved (Fig. 4). The determination of Mg by ADP crystal should be performed by using perfect crystal surface (natural surface or full etching on cut surface). The fact should be also taken into consideration in measuring fluorescent X-rays by other crystals in vacuum region.
収録刊行物
-
- 分析化学
-
分析化学 20 (6), 713-717, 1971
公益社団法人 日本分析化学会
- Tweet
キーワード
詳細情報 詳細情報について
-
- CRID
- 1390001204353904256
-
- NII論文ID
- 130000942487
-
- NII書誌ID
- AN00222633
-
- NDL書誌ID
- 8443983
-
- ISSN
- 05251931
-
- 本文言語コード
- ja
-
- データソース種別
-
- JaLC
- NDLサーチ
- Crossref
- CiNii Articles
- OpenAIRE
-
- 抄録ライセンスフラグ
- 使用不可