Molecular-weight evaluation of silicone oil on a solid surface by silver deposition/time-of-flight secondary ion mass spectrometry

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  • 銀蒸着／飛行時間型二次イオン質量分析法による固体表面でのシリコーンオイルの分子量評価
  • ギン ジョウチャク ヒコウ ジカンガタ 2ジ イオン シツリョウ ブンセキホウ ニ ヨル コタイ ヒョウメン デ ノ シリコーンオイル ノ ブンシリョウ ヒョウカ

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Abstract

Molecular ions include information about end groups, functional groups and molecular weight. A method for the directly detecting these of high mass area of more than 1000 from poly(dimethylsiloxane) (PDMS) on a solid surface was investigated. It was also found that a TOF-SIMS analysis of silver-deposited surfaces (silver deposition/TOF-SIMS) is useful for this purpose. Two methods for silver deposition, the diode sputtering method and the vacuum evaporation coating method, were tried. The former required the sample to be cooled so as to prevent damage of the sample surface due to thermal oxidation; the latter caused no damage to sample surfaces at room temperature. Using silver deposition/TOF-SIMS analysis, silver-cationized quasi-molecular ions were clearly detected from PDMS on solid surfaces, and their images were observed without the interference of deposited silver. By applying to the analysis of paint defects etc, it was confirmed that this technique is useful to analyze practical industrial materials. Silver-cationized ions were detected not only from PDMS, but also from other organic materials, such as lubricant additives and oils on solid surfaces. Therefore, silver deposition/TOF-SIMS was proved to be useful for the analysis of thin substances on solid surfaces.<br>

Journal

  • BUNSEKI KAGAKU

    BUNSEKI KAGAKU 52 (11), 979-988, 2003

    The Japan Society for Analytical Chemistry

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