低原子番号被覆層を有する平板X線導波路特性の数値シミュレーション
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- KARIMOV Pavel
- Department of Materials Science and Engineering Institute of Metal Physics, Urals Division of the Russian Academy of Sciences
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- KURMAEV Ernst Z.
- Institute of Metal Physics, Urals Division of the Russian Academy of Sciences
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- 河合 潤
- 京都大学大学院工学研究科材料工学専攻
書誌事項
- タイトル別名
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- Numerical Simulation of Planar X-Ray Waveguides with Low-Z Cladding Layers
- テイゲンシ バンゴウ ヒフクソウ オ ユウスル ヘイバン Xセン ドウハロ トクセイ ノ スウチ シミュレーション
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A numerical simulation was performed to check the aptitude of low-Z materials, like carbon and boron, to be used as cladding layers in planar X-ray waveguides with a beryllium core. For a particular incident beam-energy value, an optimization technique based on a genetic algorithm was used to find the waveguide layer thicknesses, which provided the highest electric field intensity resonant enhancement in the core layer. The results of C/Be/C and B/Be/B waveguide simulations for incident beam energies from 10 to 15 keV were compared with the results obtained for Mo/Be/Mo waveguides. This comparison showed that waveguides with low-Z cladding layers should provide a guided beam of high intensity.<br>
収録刊行物
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- 分析化学
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分析化学 55 (6), 447-452, 2006
公益社団法人 日本分析化学会
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詳細情報 詳細情報について
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- CRID
- 1390001204355176960
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- NII論文ID
- 110004738362
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- NII書誌ID
- AN00222633
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- COI
- 1:CAS:528:DC%2BD28XlvFSqu7o%3D
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- NDL書誌ID
- 7989962
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- ISSN
- 05251931
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- NDL-Digital
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可