低原子番号被覆層を有する平板X線導波路特性の数値シミュレーション

  • KARIMOV Pavel
    Department of Materials Science and Engineering Institute of Metal Physics, Urals Division of the Russian Academy of Sciences
  • KURMAEV Ernst Z.
    Institute of Metal Physics, Urals Division of the Russian Academy of Sciences
  • 河合 潤
    京都大学大学院工学研究科材料工学専攻

書誌事項

タイトル別名
  • Numerical Simulation of Planar X-Ray Waveguides with Low-Z Cladding Layers
  • テイゲンシ バンゴウ ヒフクソウ オ ユウスル ヘイバン Xセン ドウハロ トクセイ ノ スウチ シミュレーション

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抄録

A numerical simulation was performed to check the aptitude of low-Z materials, like carbon and boron, to be used as cladding layers in planar X-ray waveguides with a beryllium core. For a particular incident beam-energy value, an optimization technique based on a genetic algorithm was used to find the waveguide layer thicknesses, which provided the highest electric field intensity resonant enhancement in the core layer. The results of C/Be/C and B/Be/B waveguide simulations for incident beam energies from 10 to 15 keV were compared with the results obtained for Mo/Be/Mo waveguides. This comparison showed that waveguides with low-Z cladding layers should provide a guided beam of high intensity.<br>

収録刊行物

  • 分析化学

    分析化学 55 (6), 447-452, 2006

    公益社団法人 日本分析化学会

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