Thickness of sample in the attenuated total reflectance measurement

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Other Title
  • 赤外全反射吸収スペクトル測定における試料の厚さに関する考察
  • セキガイ ゼン ハンシャ キュウシュウ スペクトル ソクテイ ニ オケル シリョウ ノ アツサ ニ カンスル コウサツ
  • 赤外吸収スペクトルの鉄鋼研究への応用 (第3報)

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Description

When the analysis of surface-treated steel was done by means of infrared absorption, it was quite often that the spectra could not be obtained even in the attenuated total reflectance (ATR) method. It was found that this fail of measurement depended on the thickness of the surface layer, and the lower limit of its thickness was examined on practical specimens. The following equation showing the relationship between the thickness d and wavelength λ was derived from interference spectra:<BR>d=λ1λ2/4 (λ1-λ2) ·1/√n22-n12sin2θ1<BR>in which n1 and n2 are refractive indice for different media, and θ1 is incident angle.<BR>The result indicated that the thickness less than 20μ was inapplicable for a measurement in ATR method. The thickness of surface layer available for measurements by ATR method was estimated to be greater than 2025μ, taking simultaneously into consideration the depth of a layer into which light oozes out from boundary face.

Journal

  • BUNSEKI KAGAKU

    BUNSEKI KAGAKU 17 (3), 301-306, 1968

    The Japan Society for Analytical Chemistry

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