Determination of Hazardous Atmospheric Pollutants (Hazardous Elements) by X-ray Fluorescence Analysis Using Thin Film Standards.

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  • 薄膜標準試料を用いた蛍光Ｘ線分析法による有害大気汚染物質（有害元素）の測定
  • ハクマク ヒョウジュン シリョウ オ モチイタ ケイコウ Xセン ブンセキホウ

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An application of wavelength dispersive X-ray fluorescence analysis (XRF) for the determination of 20 elements, including 3 major and 17 hazardous elements, in the atmospheric particulate matters was examined. Rapid and accurate measurement of the elements could be performed by the use of thin film standards. The precision and detection limit of the method were found to be satisfactory. The method established in this study was applied to the analysis of 10 atmospheric particulate matters collected in Nara City in a period of Apr., 1997. Among 17 hazardous elements, Zn was the highest and was followed by Ti, Mn, Br, Ba, Cr, Sb, V, Sn, Ni, As and Se. Co, Pd, Ce, Pt and Tl were less than detection limits. The principal component analysis showed that metal elements were divided into three major groups.

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