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- KIM Joung-Yeal
- School of Information and Communication Engineering, Sungkyunkwan University Samsung Electronics
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- PARK Su-Jin
- School of Information and Communication Engineering, Sungkyunkwan University Samsung Electronics
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- KIM Yong-Ki
- School of Information and Communication Engineering, Sungkyunkwan University
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- HAN Sang-Keun
- School of Information and Communication Engineering, Sungkyunkwan University Samsung Electronics
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- JUN Young-Hyun
- Samsung Electronics
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- LEE Chilgee
- School of Information and Communication Engineering, Sungkyunkwan University
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- HAN Tae Hee
- School of Information and Communication Engineering, Sungkyunkwan University
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- KONG Bai-Sun
- School of Information and Communication Engineering, Sungkyunkwan University
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説明
A new mixed-voltage I/O buffer for low-voltage low-latency operation is proposed in this paper. The proposed buffer adopts a novel delay-based timing-control scheme to efficiently avoid problems like gate-oxide stress and hot-carrier degradation. The proposed timing-control scheme also allows the buffer to have a lower latency for transmitting data by avoiding the use of timing-critical circuits like series-connected transmission gates (TGs) and triple-stacked transistors. The latency for receiving data at low supply voltage is also reduced by employing a variable stacked transistor gate-biasing scheme. Comparison results in an 80-nm CMOS process indicated that the proposed mixed-voltage I/O buffer improved up to 79.3% for receiving the external data and up to 23.8% for transmitting the internal data at a supply voltage of 1.2V.
収録刊行物
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- IEICE Transactions on Electronics
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IEICE Transactions on Electronics E93-C (5), 709-711, 2010
一般社団法人 電子情報通信学会
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詳細情報 詳細情報について
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- CRID
- 1390001204376929792
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- NII論文ID
- 10026825791
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- NII書誌ID
- AA10826283
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- ISSN
- 17451353
- 09168524
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- Crossref
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- 抄録ライセンスフラグ
- 使用不可