A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing
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- YAMATO Yuta
- Fukuoka Industry, Science & Technology Foundation
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- WEN Xiaoqing
- Kyushu Institute of Technology
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- MIYASE Kohei
- Kyushu Institute of Technology
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- FURUKAWA Hiroshi
- Kyushu Institute of Technology
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- KAJIHARA Seiji
- Kyushu Institute of Technology
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抄録
Power-aware X-filling is a preferable approach to avoiding IR-drop-induced yield loss in at-speed scan testing. However, the ability of previous X-filling methods to reduce launch switching activity may be unsatisfactory, due to low effect (insufficient and global-only reduction) and/or low scalability (long CPU time). This paper addresses this reduction quality problem with a novel GA (Genetic Algorithm) based X-filling method, called GA-fill. Its goals are (1) to achieve both effectiveness and scalability in a more balanced manner and (2) to make the reduction effect of launch switching activity more concentrated on critical areas that have higher impact on IR-drop-induced yield loss. Evaluation experiments are being conducted on both benchmark and industrial circuits, and the results have demonstrated the usefulness of GA-fill.
収録刊行物
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- IEICE Transactions on Information and Systems
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IEICE Transactions on Information and Systems E94-D (4), 833-840, 2011
一般社団法人 電子情報通信学会
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詳細情報 詳細情報について
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- CRID
- 1390001204379523072
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- NII論文ID
- 10029506602
- 120005895733
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- NII書誌ID
- AA10826272
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- ISSN
- 17451361
- 09168532
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- HANDLE
- 10061/11104
- 10228/00007531
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- IRDB
- Crossref
- CiNii Articles
- KAKEN
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- 抄録ライセンスフラグ
- 使用不可