Analyses of Ultrahigh Pressure Materials by an Analytical Elelctron Microscope.

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  • 分析電子顕微鏡による超高圧物質の解析
  • ブンセキ デンシ ケンビキョウ ニ ヨル チョウコウアツ ブッシツ ノ カイセキ

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Abstract

Analyses of ultrahigh pressure materials by an analytical electron microscope (AEM) are reviewed. AEM provides important advantages for analyzing synthetic and natural ultrahigh pressure materials because it enables us to analyze both structure and composition of these materials down to tens of nm-sized grains. Using AEM, several new high-pressure minerals were discovered in shocked meteorites, and new phases and new phase transformation behaviors were recognized in ultrahigh pressure experiments under the Earth's lower mantle conditions.

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