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- 高橋 幸生
- 大阪大学大学院 工学研究科 精密科学・応用物理学専攻
書誌事項
- タイトル別名
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- Coherent X-Ray Diffractive Imaging
- コヒーレント Xセン カイセツ イメージング
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抄録
Coherent X-ray diffractive imaging (CXDI) allows us to observe thick objects with a high spatial resolution, also providing us with unique structural information, i.e., electron density distribution and/or strain distribution. We have developed high-resolution diffractive imaging apparatus using the high-intensity X-ray beam focused by total reflection mirrors at SPring-8 and have demonstrated high-resolution plane-wave CXDI and scanning CXDI (i.e. X-ray ptychography). In addition, we have demonstrated element-specific X-ray ptychography using anomalous scattering around a specific element. In the near future, CXDI will become a promising tool for structure investigation in various fields including high-pressure science.<br>
収録刊行物
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- 高圧力の科学と技術
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高圧力の科学と技術 23 (3), 237-244, 2013
日本高圧力学会
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詳細情報 詳細情報について
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- CRID
- 1390001204382009216
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- NII論文ID
- 10031201662
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- NII書誌ID
- AN10452913
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- COI
- 1:CAS:528:DC%2BC3sXhvVaksLzP
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- ISSN
- 13481940
- 0917639X
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- NDL書誌ID
- 024922289
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可