Optical Spectroscopic Study on t h e Excitation and Ionization Processes of CS Radicals by Electron Impact

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  • TSUJI Masaharu
    Institute of Advanced Material Study, Graduate Schoolo f Engineering Sciences, Kyushu University Department of Molecular Science and Technology, Graduate School of Engineering Sciences, Kyushu University
  • SHIMADAH Shinichi
    Institute of Advanced Material Study, Graduate Schoolo f Engineering Sciences, Kyushu University Department of Molecular Science and Technology, Graduate School of Engineering Sciences, Kyushu University
  • OBASE Hiroshi
    Institute of Advanced Material Study, Graduate Schoolo f Engineering Sciences, Kyushu University Department of Molecular Science and Technology, Graduate School of Engineering Sciences, Kyushu University
  • NISHIMURA Yukio
    Institute of Advanced Material Study, Graduate Schoolo f Engineering Sciences, Kyushu University Department of Molecular Science and Technology, Graduate School of Engineering Sciences, Kyushu University

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Other Title
  • 電子衝撃によるCSラジカルの励起・イオン化過程の分光学的研究
  • デンシ ショウゲキ ニ ヨル CS ラジカル ノ レイキ イオンカ カテイ ノ

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Description

Excitation and ionization processes of CS radicals by electro n impact have been studied in the energy range of 10-300eV by observing UV and visible emissions from excited products. The CS(X1∑+) radicals were generated by a microwave discharge of a mixture of CS5 and Ar or He. The spectra consisted of the CS+(B2∑+-A2II) and CS(A1II-X1∑+υ=0-2) systems. The emission cross section of CS+(B-A) was smaller t han that of CS (A-X) by a factor of about 8. The CS+(B) and CS(A) vibrational populations in the CS2/He mixture were in reasonable agreement with Franck-Condon factors (FCFs) for the C S(X: υ=0)→CS+(B, υ') ionization and the CS(X, υ"=0)→ CS(A, υ') excitation. On the other hand, the CS(B) and CS(A) vibrational populations in the CS2/Ar mixture were diff erent from those predicted from the above FCFs. These deviations could be explained by taking account of a small amount of vibrational excited CS radicals (Ny=1Nυ=0=0.15) in th e CS (X) radical.

Journal

  • NIPPON KAGAKU KAISHI

    NIPPON KAGAKU KAISHI 1989 (8), 1275-1277, 1989-08-10

    The Chemical Society of Japan

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