分光感度応答電流を使用した接合特性解析の方法と応用

DOI Web Site Web Site 被引用文献1件 参考文献15件

書誌事項

タイトル別名
  • Application of the Spectral Sensitivity for the Semiconductor Junction Analysis
  • ブンコウ カンド オウトウ デンリュウ オ シヨウ シタ セツゴウ トクセイ カイセキ ノ ホウホウ ト オウヨウ

この論文をさがす

抄録

In this report, the spectral sensitivity was used for semiconductor junction analysis. This analysis is carried out by means of a photoconduction characteristic depend on the electric field strength in the material. The light absorption and the photoconduction current are in proportion, and the electric field strength in the material is known by way of comparing the photoconduction current to the light absorption. The material has different absorption coefficients each wave lengths, and has different complete light absorption lengths. Then, it is possible to select the analysis area at the material, if select appropriate wave length. From this analysis method, the electric field strength and the potential along thickness of the material can be evaluated. This analysis method was applied to evaluate the electric field strength on the ITO-ZnSe junction, and the potential distribution and the depletion layer were evaluated. As a result, it was found that ZnSe layer had space charges near the junction.

収録刊行物

被引用文献 (1)*注記

もっと見る

参考文献 (15)*注記

もっと見る

キーワード

詳細情報 詳細情報について

問題の指摘

ページトップへ