Discussion on System Non-uniformity and Sensitivity Improvement for 2-dimensional Birefringence Vector Distribution Measurement
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- Koyama Takehiro
- Musashi Institute of Technology
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- Zhu Yongchang
- Musashi Institute of Technology
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- Takada Tatsuo
- Musashi Institute of Technology
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- Murooka Yoshihiro
- Musashi Institute of Technology
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- Otsuka Toshihisa
- Musashi Institute of Technology
Bibliographic Information
- Other Title
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- 2次元複屈折測定におけるシステム不均一性と感度向上の検討
- 2ジゲンフククッセツ ソクテイ ニ オケル システム フキンイツセイ ト カン
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Abstract
A two-dimensional measurement method for a birefringence vector distribution differs from a point measurement not only in the two-dimensional system non-uniformity, but also in the system reliability. An optical phase pulsed modulation is employed to simplify the two-dimensional mathematical analysis. As a result, concepts are proposed of the system function, which characterizes the system non-uniformity resulting from the system components, and of the intrinsic function, which is related to the birefringent sample. The influence of the system non-uniformity on the two-dimensional measurement is eliminated by measurement of the intrinsic function while its two values allow the mathematical separation of the birefringence vector components. The effectiveness of the two-dimensional analysis is illustrated by the measurement of a birefringence vector distribution induced by an internal stress distribution in a PMMA plate due to the photo-elastic effect.
Journal
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- IEEJ Transactions on Sensors and Micromachines
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IEEJ Transactions on Sensors and Micromachines 118 (10), 467-474, 1998
The Institute of Electrical Engineers of Japan
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Details 詳細情報について
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- CRID
- 1390001204461556736
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- NII Article ID
- 10005323830
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- NII Book ID
- AN1052634X
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- ISSN
- 13475525
- 13418939
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- NDL BIB ID
- 4565950
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed