Lensless CMOS Imaging Device for Fluorescent and Non-Fluorescent Imaging Dedicated to Digital ELISA
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- Sasagawa Kiyotaka
- Graduate School of Materials Science, Nara Institute of Science and Technology Japan Science and Technology Agency-CREST
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- Takehara Hironari
- Graduate School of Materials Science, Nara Institute of Science and Technology Japan Science and Technology Agency-CREST
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- Nagasaki Mizuki
- Graduate School of Materials Science, Nara Institute of Science and Technology
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- Takehara Hiroaki
- Graduate School of Materials Science, Nara Institute of Science and Technology Japan Science and Technology Agency-CREST
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- Noda Toshihiko
- Graduate School of Materials Science, Nara Institute of Science and Technology Japan Science and Technology Agency-CREST
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- Tokuda Takashi
- Graduate School of Materials Science, Nara Institute of Science and Technology Japan Science and Technology Agency-CREST
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- Noji Hiroyuki
- Japan Science and Technology Agency-CREST Department of Applied Chemistry, School of Engineering, The University of Tokyo
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- Ohta Jun
- Graduate School of Materials Science, Nara Institute of Science and Technology Japan Science and Technology Agency-CREST
Bibliographic Information
- Other Title
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- デジタルELISAに向けた蛍光および非蛍光計測用レンズレスCMOSイメージングシステム
- デジタル ELISA ニ ムケタ ケイコウ オヨビ ヒケイコウ ケイソクヨウ レンズレス CMOS イメージング システム
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Description
We report a lensless complementary metal-oxide-semiconductor (CMOS) imaging device that can obtain fluorescence and non-fluorescence images for digital enzyme linked immunosorbent assay (ELISA). In lensless imaging, it is important to manage the degradation of the spatial resolution with beam propagation. For fluorescence imaging, we applied an image processing technique based on deconvolution method to recover the spatial resolution. For non-fluorescence imaging, a collimated illumination is used and the detection error is reduced by using an angle scanning technique.
Journal
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- IEEJ Transactions on Sensors and Micromachines
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IEEJ Transactions on Sensors and Micromachines 136 (1), 12-17, 2016
The Institute of Electrical Engineers of Japan
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Details 詳細情報について
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- CRID
- 1390001204462429568
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- NII Article ID
- 130005116273
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- NII Book ID
- AN1052634X
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- ISSN
- 13475525
- 13418939
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- NDL BIB ID
- 027041387
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed