Invited, review: Uncertainty in quantification of binary alloy films and thickness measurement of nm oxide films
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- Kim Kyung Joong
- Division of Industrial Metrology, Korea Research Institute of Standards and Science
書誌事項
- タイトル別名
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- Uncertainty in Quantification of Binary Alloy Films and Thickness Measurement of nm Oxide Films
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Recent activities on the quantification of alloy films and the thickness measurement of ultra-thin oxide films are reviewed in this paper. The quantification and in-depth analysis are the main applications of surface analysis methods. However, surface analyses require certified reference materials because the determinations of the film thickness and the quantities of constituent elements by surface analysis methods are not absolute. International standardization on surface chemical analysis is focused on the establishment of traceability and the reduction of the measurement uncertainty. Pilot studies and key comparisons were performed for the measurements of the thickness of nm SiO2 films and the chemical composition of binary alloy films by the surface analysis working group of the consultative committee for amount of substance.
収録刊行物
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- Journal of Surface Analysis
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Journal of Surface Analysis 17 (3), 177-185, 2011
一般社団法人 表面分析研究会
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詳細情報 詳細情報について
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- CRID
- 1390001204471297280
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- NII論文ID
- 130005138935
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- NII書誌ID
- AA11448771
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- ISSN
- 13478400
- 13411756
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- NDL書誌ID
- 11077400
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可