45 Years in Monte Carlo Simulation for Microbeam Analysis
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- Shimizu Ryuichi
- International Institute for Advanced Studies
Bibliographic Information
- Other Title
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- Invited, review: 45 years in Monte Carlo simulation for microbeam analysis: a personal retrospective review
- A personal retrospective review
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Abstract
Monte Carlo (MC) simulations for microbeam analysis, in which the author has been involved for 45 years, are retrospectively reviewed by tracing the development of simulations models for describing complicated scattering processes of incident projectiles (electron, ion, etc.) in matter. The simulation model is based on the uses of theoretical expressions which describe elastic and inelastic scattering, respectively, no matter whether incident projectile be electron or ion.<br>MC simulation modellings of different types are outlined by presenting applications to microbeam analysis with primary electrons and ions, respectively, drawing attention into the close correlation between a new modeling and a new micoanalytical instrumentation that was marketed at different times.<br>Finally, the author takes a liberty to propose an international cooperative joint work for database construction of secondary electron yield, by introducing the working group activities which the JSPS-141 committee (microbeam analysis) has supported since 2009.
Journal
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- Journal of Surface Analysis
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Journal of Surface Analysis 17 (3), 157-162, 2011
The Surface Analysis Society of Japan
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Details 詳細情報について
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- CRID
- 1390001204471300224
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- NII Article ID
- 130005138932
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- NII Book ID
- AA11448771
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- ISSN
- 13478400
- 13411756
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- NDL BIB ID
- 11077390
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- Text Lang
- en
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed