The Backscattering Correction Factor in AES: A New Outlook
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- Jablonski A.
- Institute of Physical Chemistry, Polish Academy of Sciences
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- Powell C. J.
- Surface and Microanalysis Science Division, National Institute of Standards and Technology
Bibliographic Information
- Other Title
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- Invited paper: The backscattering correction factor in AES: a new outlook
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Abstract
There is currently renewed interest in the backscattering correction for Auger electron spectroscopy (AES). There are several reasons for this interest. First, the energy of the primary-beam energy reaches 25 keV in modern AES instruments and Shimizu's predictive formulae based on calculations for primary energies between 3 keV and 10 keV are of uncertain validity at higher energies. Second, it has been shown recently that the present definition of the backscattering factor is based on a simplified model of electron transport that breaks down for low primary energies and/or more grazing-incidence angles. A new term, the backscattering correction factor (BCF) has therefore been introduced that is based on an advanced model of electron transport. Third, much progress has been recently made in the theory of electron transport and the data for electron-scattering parameters which should improve the reliability of calculated backscattering correction factors. Finally, the BCF from the advanced theoretical model has been found to depend on numerous parameters defining the solid, the selected Auger transition, and the experimental configuration. Since the derivation of a simple predictive formula for the BCF does not seem to be feasible, a computer-controlled database has been developed to provide BCFs for a user-specified material and experimental configuration. Examples are given of BCFs from the advanced and simplified models for Ag M4N45N45 Auger electrons from silver.
Journal
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- Journal of Surface Analysis
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Journal of Surface Analysis 17 (3), 213-219, 2011
The Surface Analysis Society of Japan
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Details 詳細情報について
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- CRID
- 1390001204471314304
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- NII Article ID
- 130005138942
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- NII Book ID
- AA11448771
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- ISSN
- 13478400
- 13411756
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- NDL BIB ID
- 11077484
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- Text Lang
- en
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed