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- Hirao Norie
- Japan Atomic Energy Agency
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- Baba Yuji
- Japan Atomic Energy Agency
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- Sekiguchi Tetsuhiro
- Japan Atomic Energy Agency
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- Shimoyama Iwao
- Japan Atomic Energy Agency
書誌事項
- タイトル別名
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- Quick Observation of Photoelectron Emission Microscopy with Focused Soft X-rays using Poly-capillary Lens
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In order to study dynamic phenomena in a microscopic region of solid surfaces, it is important to observe element, chemical-state, and molecular-orientation mappings at nanometer scale in a short time. In the previous study, we have developed a photoelectron emission microscopy (PEEM) system combined with soft X-rays from synchrotron light source, and demonstrated that the method can be applied to the observation on chemical-state mapping of silicon compounds at nanometer scale [1]. In the present work, in order to apply this method to the observation of fast phenomena, we explored the focusing of soft X-ray (1.8 - 4 keV) using a poly-capillary lens, and examined the minimum measuring time by PEEM. By adjusting the poly-capillary lens, the brightness of the measuring spot by PEEM became about 55 times higher than that without the lens. Consequently, we can take a PEEM image of a bulk sample in 10 msec. The measuring times for elemental mapping and chemical-state mapping were also examined by scanning the energy of X-ray. As a result, the typical minimum measuring times were in the order of 10 sec for elemental mapping and one minute for chemical-state mapping. It is demonstrated that the method will be applicable to the real-time observation of time-dependent phenomena in the order from msec to sec at nanometer scale.
収録刊行物
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- Journal of Surface Analysis
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Journal of Surface Analysis 17 (3), 227-231, 2011
一般社団法人 表面分析研究会
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詳細情報 詳細情報について
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- CRID
- 1390001204471317632
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- NII論文ID
- 130005138945
- 120006502237
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- NII書誌ID
- AA11448771
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- ISSN
- 13478400
- 13411756
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- NDL書誌ID
- 11077504
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- IRDB
- NDL
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- CiNii Articles
- KAKEN
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- 使用不可