AN OPTIMUM AGING SEQUENCE OF THIN FILM EL PANEL

DOI

Bibliographic Information

Other Title
  • 薄膜ACELパネルの最適エージング法

Search this article

Description

A new aging sequence consisting of three steps was developed to minimize the diameter of pinhole failures and to reduce aging time. 1) Point defects are eliminated by discharge line by line, appling relative low-power pulse voltage (around threshold voltage, 20μs). 2) The power consumption of EL panel is minimized. Most of the point defects are eliminated by these two steps. 3) The initial shift of Brightness-Voltage relationship is stabilized in an accelated condition. As a result, a 640×400 pixel EL panel was obtained.

Journal

  • ITE Technical Report

    ITE Technical Report 11 (8), 43-48, 1987

    The Institute of Image Information and Television Engineers

Details 詳細情報について

  • CRID
    1390001204518086912
  • NII Article ID
    110003684524
  • DOI
    10.11485/tvtr.11.8_43
  • ISSN
    24330914
    03864227
  • Text Lang
    ja
  • Data Source
    • JaLC
    • CiNii Articles
  • Abstract License Flag
    Disallowed

Report a problem

Back to top