Analysis of write process considering thermal fluctuation in perpendicular magnetic recording
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- Kuroda A.
- Central Research Laboratory, Hitachi, Ltd.
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- Nishida Y.
- Central Research Laboratory, Hitachi, Ltd.
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- Nakamura A.
- Central Research Laboratory, Hitachi, Ltd.
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- Takano H.
- Central Research Laboratory, Hitachi, Ltd.
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- Narishige S.
- Data Storage & Retrieval System Div., Hitachi, Ltd.
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- Aoi H.
- Data Storage & Retrieval System Div., Hitachi, Ltd.
Bibliographic Information
- Other Title
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- 垂直磁気記録方式における熱減磁を考慮した記録過程の解析
- スイチョク ジキ キロク ホウシキ ニ オケル ネツ ゲンジ オ コウリョ シタ キロク カテイ ノ カイセキ
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Abstract
We analyzed the write process considering temperature and write frequency to determine the difference from the conventional self-consistent analysis. The extended Neel-Arrhenius type model with two different time constants for high and low energy barrier can approximate the coercive field versus frequency of hysteresis loop calculated by the method of Langevin equation. As the linear density becomes higher, the transition parameter becomes smaller and the amplitude of written pattern becomes larger compared to the superposition of the isolated transition.
Journal
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- ITE Technical Report
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ITE Technical Report 25.37 (0), 7-12, 2001
The Institute of Image Information and Television Engineers
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Keywords
Details 詳細情報について
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- CRID
- 1390001204525973888
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- NII Article ID
- 110003688997
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- NII Book ID
- AN1059086X
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- ISSN
- 24241970
- 13426893
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- NDL BIB ID
- 5834812
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- CiNii Articles
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- Abstract License Flag
- Disallowed