A Method of the Projection Pattern Control for 3D Image Measurement

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  • CHO Genki
    Faculty of Engineering, Fukuoka Institute of Technology
  • LU Cunwei
    Faculty of Engineering, Fukuoka Institute of Technology

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Other Title
  • 3次元画像計測における投影光強度制御の一手法
  • 3ジゲン ガゾウ ケイソク ニ オケル トウエイコウ キョウド セイギョ ノ イチシュホウ
  • 3ジゲン ガゾウ ケイソク ニ オケル トウエイ ヒカリ キョウド セイギョ ノ 1シュホウ

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Abstract

Until now, many thing 3-D image measurement techniques have been proposed. The measurement which projects a projection pattern is also one of them. However, if measurement environment and a measurement object change, the accuracy of measurement will become bad or the measurement will become impossible in the case of the fixed measurement parameter is used. In order to solve the above-mentioned problem a technique is proposed to control the size and the intensity distribution of the projection pattern. If the optimum projection pattern can be projected according to a measurement scene, more active 3-D image measurement will be attained. This paper describes mainly the technique of the intensity control of a projection pattern automatically.

Journal

  • ITE Technical Report

    ITE Technical Report 25.77 (0), 15-20, 2001

    The Institute of Image Information and Television Engineers

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