Consideration of Direct Bit-Rate Measuring Method based on Extracting Envelope Signal
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- Otani Akihito
- Anritsu Corporation Graduate School of Science and Engineering, Saga University
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- Tsuda Yukio
- Anritsu Corporation
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- Igawa Koji
- Anritsu Corporation
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- Shida Katsunori
- Graduate School of Science and Engineering, Saga University
Bibliographic Information
- Other Title
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- 包絡線信号抽出によるビットレート直接測定法の検討
- ホウラクセン シンゴウ チュウシュツ ニ ヨル ビット レート チョクセツ ソクテイホウ ノ ケントウ
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Abstract
We previously developed an optical sampling oscilloscope (EDT-OSO) based on an envelope detection triggering method. This EDT-OSO can stably measure eye-diagram waveforms of signals exceeding 100Gbps without an external high-frequency clock signal. However far-end waveform measurements during a long distance place could not be realized. Because the EDT-OSO requires to link 10-MHz time bases in the EDT-OSO and a light under test (LUT) generator for synchrinizing.<br>To overcom this drawbak, we developed a direct bit-rate measureing method for synchronizing both 10-MHz time bases vartually and a self-synchronized EDT-OSO (SSEDT-OSO) based on this method simulteniously. We confirmed that a bit-rate measurement repetability of the SSEDT-OSO was from 10-9 to 10-8 by evaluating a standard deviation and the SSEDT-OSO could measure an eye-diagram without linking 10-MHz time bases.<br>This paper explains the basic principle for measuring the bit-rate of the LUT directly. Furthermore, we describe a configuration of the SSEDT-OSO and evalluation results.
Journal
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- IEEJ Transactions on Fundamentals and Materials
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IEEJ Transactions on Fundamentals and Materials 128 (11), 669-675, 2008
The Institute of Electrical Engineers of Japan
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Details 詳細情報について
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- CRID
- 1390001204593080832
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- NII Article ID
- 10024343090
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- NII Book ID
- AN10136312
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- ISSN
- 13475533
- 03854205
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- NDL BIB ID
- 9698449
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed