More Accurate Breakdown Voltage Estimation for the New Step-up Test Method for Various Probability Distribution Models
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- Hirose Hideo
- Department of Systems Innovation and Informatics, Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology
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The step-up method is used to estimate the impulse breakdown voltageswhen the electrical insulation is not usable after it is broken. This paper analyses the reliability of the estimates of the underlying breakdown probability distribution inthe step-up method, when (1) the observed breakdown voltage itself is available and (2)it is not available. The former case has many advantages compared to the latter case such that (1) the confidence intervals of the estimates become smaller and (2) theestimates can be obtained in stable. This paper summarizes the results of the three cases that the underlying probability distribution for the breakdown voltage is assumedto be normal, Weibull, and gumbel types. The optimal test method is simply and clearlydescribed for various distribution models.
収録刊行物
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- 電気学会論文誌． Ａ
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電気学会論文誌． Ａ 124 (7), 587-592, 2004
一般社団法人 電気学会
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詳細情報 詳細情報について
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- CRID
- 1390001204593329536
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- NII論文ID
- 10013267728
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- NII書誌ID
- AN10136312
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- ISSN
- 13475533
- 03854205
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- NDL書誌ID
- 7019522
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
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- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可
