Applications of Terahertz Time-Domain Reflectometry
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- Kitahara Hideaki
- Institute of Laser Engineering, Osaka University
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- Takano Keisuke
- Institute of Laser Engineering, Osaka University
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- Ikeda Takeshi
- Forensic Science Laboratory, Osaka Prefecture Police Headquarters
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- Tani Masahiko
- Institute of Laser Engineering, Osaka University
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- Hangyo Masanori
- Institute of Laser Engineering, Osaka University
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Abstract
A reflection-type terahertz (THz) time-domain spectroscopy (TDS) is applied to non-contact and non-destructive diagnosis of the surface and inner-structure of test samples. Raster scan imaging and THz optical coherence tomography (THz-OCT) are demonstrated for a bank bill, a high voltage cable and an indented impression on a memo-pad paper. The watermark of the bank bill, the indented impression, and a flaw in the cable are detected successfully. These results indicate that THz imaging is potentially useful for the analysis of surfaces and inner-structures of products made with various materials.
Journal
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- IEEJ Transactions on Fundamentals and Materials
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IEEJ Transactions on Fundamentals and Materials 127 (7), 391-396, 2007
The Institute of Electrical Engineers of Japan
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Details 詳細情報について
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- CRID
- 1390001204593587456
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- NII Article ID
- 10019523432
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- NII Book ID
- AN10136312
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- ISSN
- 13475533
- 03854205
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- NDL BIB ID
- 8878242
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- Text Lang
- en
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed