書誌事項
- タイトル別名
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- Invasiveness of an Optical Magnetic Field Probe Consisting of a Loop Antenna Element and an Electro-Optic Crystal
- ループコイルガタ ヒカリ ジカイ プローブ ノ シンシュウセイ ヒョウカ
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抄録
When probes are positioned close to a device being tested, the electromagnetic field distribution is inevitably changed to some extent. The change affects the measurement accuracy and the operation of devices. In order to perform magnetic near-field measurement with high accuracy in the GHz frequency range, we are developing an optical magnetic field probe that consists of a loop antenna element and an LiNbO3 crystal. In this paper, the invasiveness of the optical magnetic field probe was quantitatively evaluated by experiment and FDTD method simulation. The undesired output caused by electric field is substantially suppressed owing to the symmetrical structure of the probe. The disturbance of the surrounding electromagnetic field is reduced by eliminating the metallic cable and consisting of a few metallic elements. The influence on operation of the device is comparatively small when the probe is positioned close to the device. This study indicated that the optical magnetic field probe is less invasive and suitable for an accurate measurement.
収録刊行物
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- 電気学会論文誌． Ａ
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電気学会論文誌． Ａ 125 (2), 125-132, 2005
一般社団法人 電気学会
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詳細情報 詳細情報について
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- CRID
- 1390001204594957568
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- NII論文ID
- 10014302515
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- NII書誌ID
- AN10136312
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- ISSN
- 13475533
- 03854205
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- NDL書誌ID
- 7237256
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可