Surface Charge Measurement on Solid Dielectrics with an Electrostatic Probe
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- Tatematsu Akiyoshi
- Kyoto University
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- Aoki Kojiro
- Kyoto University
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- Hamada Shoji
- Kyoto University
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- Uemura Takuji
- The Kansai Electric Power Co. Inc.
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- Takuma Tadasu
- Komae Research Laboratory, Central Research Institute of Electric Power Industry (CRIEPI)
Bibliographic Information
- Other Title
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- 静電プローブによる固体絶縁物の帯電電荷測定
- セイデンプローブ ニ ヨル コタイ ゼツエンブツ ノ タイデン デンカ ソクテイ
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Abstract
Charge accumulation on thick solid dielectrics may seriously influence surface discharge and insulation characteristics in SF6, oil, or vacuum, which are the leading insulators for the recent high voltage equipment. Nevertheless, charge measurement technique in such environment has not been fully developed in practical level. One of the authors once proposed a probe method based on multipoint measurement. The procedure is as follows, (i) represent the relationship between charge distribution σ and the multipoint probe-outputs Wp as Aσ=Wp, (ii) calculate the matrix A by a numerical field calculation faithfully simulating the experimental arrangement, and (iii) estimate σ by an inverse calculation of (i) from the measured outputs. In recent papers, we have reported the improved accuracy and stability of (ii) and (iii), respectively, through numerical simulation studies. In this paper, we experimentally measure accumulated charges on a model insulator in order to confirm our numerical improvements. The effects of the following items are investigated, (a) difference of calculation methods of the matrix A, (b) distance between the probe and the insulator surface, (c) length of the guard electrode, and (d) thickness of the insulator. In all cases, we have successfully estimated the charge distribution in practical accuracy.
Journal
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- IEEJ Transactions on Fundamentals and Materials
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IEEJ Transactions on Fundamentals and Materials 123 (10), 1051-1057, 2003
The Institute of Electrical Engineers of Japan
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Details 詳細情報について
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- CRID
- 1390001204594970880
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- NII Article ID
- 10011750507
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- NII Book ID
- AN10136312
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- ISSN
- 13475533
- 03854205
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- NDL BIB ID
- 6719040
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed