書誌事項
- タイトル別名
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- Surface Charge Measurement on Solid Dielectrics with an Electrostatic Probe
- セイデンプローブ ニ ヨル コタイ ゼツエンブツ ノ タイデン デンカ ソクテイ
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Charge accumulation on thick solid dielectrics may seriously influence surface discharge and insulation characteristics in SF6, oil, or vacuum, which are the leading insulators for the recent high voltage equipment. Nevertheless, charge measurement technique in such environment has not been fully developed in practical level. One of the authors once proposed a probe method based on multipoint measurement. The procedure is as follows, (i) represent the relationship between charge distribution σ and the multipoint probe-outputs Wp as Aσ=Wp, (ii) calculate the matrix A by a numerical field calculation faithfully simulating the experimental arrangement, and (iii) estimate σ by an inverse calculation of (i) from the measured outputs. In recent papers, we have reported the improved accuracy and stability of (ii) and (iii), respectively, through numerical simulation studies. In this paper, we experimentally measure accumulated charges on a model insulator in order to confirm our numerical improvements. The effects of the following items are investigated, (a) difference of calculation methods of the matrix A, (b) distance between the probe and the insulator surface, (c) length of the guard electrode, and (d) thickness of the insulator. In all cases, we have successfully estimated the charge distribution in practical accuracy.
収録刊行物
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- 電気学会論文誌. A
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電気学会論文誌. A 123 (10), 1051-1057, 2003
一般社団法人 電気学会
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詳細情報 詳細情報について
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- CRID
- 1390001204594970880
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- NII論文ID
- 10011750507
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- NII書誌ID
- AN10136312
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- ISSN
- 13475533
- 03854205
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- NDL書誌ID
- 6719040
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
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- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可