Polarization reversal switching kinetics of pulsed laser deposited PZT/YBCO/MgO heterostructure thin films.
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- Yamazato Masaaki
- Kumamoto University
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- Grishin Alexander M.
- Sweden Royal Institute Technology
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- Yamagata Yukihiko
- Kumamoto University
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- Ikegami Tomoaki
- Kumamoto University
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- Ebihara Kenji
- Kumamoto University
Bibliographic Information
- Other Title
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- PLD法により作製したPZT/YBCO/MgOヘテロ構造薄膜の分極反転機構
- PLDホウ ニ ヨリ サクセイ シタ PZT YBCO MgO ヘテロ コウゾウ ハクマク ノ ブンキョク ハンテン キコウ
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Abstract
We have fabricated epitaxial PbZr0.52Ti0.48O, (PZT)/YBa2Cu3O7-x (YBCO) films (ferroelectric/superconductor/heterostructures) on the single-crystal MgO substrates by a KrF pulsed laser deposition technique. The heterostructure has high electric resistivity p (at 150 kV/cm) of 4×1011 Ω•cm, dielectric permittivity of 820 and loss tan δ of 0.04, remnant polarization of 32μC/cm2 and coercive field of 41kV/cm. Film thickness dependence of the coercive electric field over the thickness range 0.04-1.2μm is in close agreement with prolate ellipsoid nucleus model proposed by Kay and Dunn. Switching property of the fabricated epitaxial PZT thin films corresponds to ferroelectric needle-like nucleus growth.
Journal
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- IEEJ Transactions on Fundamentals and Materials
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IEEJ Transactions on Fundamentals and Materials 119 (1), 118-123, 1999
The Institute of Electrical Engineers of Japan
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Details 詳細情報について
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- CRID
- 1390001204598027648
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- NII Article ID
- 130006838075
- 10004441769
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- NII Book ID
- AN10136312
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- ISSN
- 13475533
- 03854205
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- NDL BIB ID
- 971660
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed