- 【Updated on May 12, 2025】 Integration of CiNii Dissertations and CiNii Books into CiNii Research
- Trial version of CiNii Research Knowledge Graph Search feature is available on CiNii Labs
- 【Updated on June 30, 2025】Suspension and deletion of data provided by Nikkei BP
- Regarding the recording of “Research Data” and “Evidence Data”
Deterioration Mechanism of Paper Base Phenolic Insulators for Power Distribution Equipment
-
- Miki Shinsuke
- Advanced Technology R&D Center, Mitsubishi Electric Corp.
-
- Umemura Sonoko
- Advanced Technology R&D Center, Mitsubishi Electric Corp.
-
- Okazawa Hiroshi
- Power Distribution System Center, Mitsubishi Electric Corp.
-
- Otsuka Yasushi
- Power Distribution System Center, Mitsubishi Electric Corp.
-
- Matsuki Hisao
- Power Distribution System Center, Mitsubishi Electric Corp.
Bibliographic Information
- Other Title
-
- 受配電機器用紙基材フェノール絶縁物の劣化進展メカニズム
- ジュハイデン キキ ヨウ カミキザイ フェノール ゼツエンブツ ノ レッカ シンテン メカニズム
Search this article
Description
We verified by analyses of new and used paper base phenolic insulators and an acceleration test that the main reason for surface resistivity reduction in paper base phenolic insulators was the permeation of deliquescent ion compounds into the insulators. The main elements were Na and Cl, which were detected by element mapping analysis both on the cross section and surface of insulators, though Al and Si were detected only on the insulators' surface. The mechanism was presumed from the results of these analyses as follows. (1) Deliquescent ion compounds such as sodium chloride, calcium sulfurate, etc. adhere to the insulators' surface. (2) They absorb water in the air. (3) Aqueous solutions of sodium chloride, calcium sulfurate, etc. permeate into the insulators. (4) Though the deliquescent ion compounds adhering to insulators can be removed by cleaning, it is difficult to remove the permeated compounds. Therefore, the insulators deteriorate progressively over time. To verify this mechanism, a deliquescent ion compound (ex. sodium bromide) was put on the used insulators and a composite temperature/humidity cyclic test was executed. The above mechanism could be verified because Na and Br elements were detected by element mapping analyses on the cross section of the accelerated test samples and the permeated Na and Br elements could not be removed by cleaning.
Journal
-
- IEEJ Transactions on Fundamentals and Materials
-
IEEJ Transactions on Fundamentals and Materials 130 (3), 232-238, 2010
The Institute of Electrical Engineers of Japan
- Tweet
Keywords
Details 詳細情報について
-
- CRID
- 1390001204598534528
-
- NII Article ID
- 10026225377
-
- NII Book ID
- AN10136312
-
- ISSN
- 13475533
- 03854205
-
- NDL BIB ID
- 10599880
-
- Text Lang
- ja
-
- Data Source
-
- JaLC
- NDL Search
- Crossref
- CiNii Articles
-
- Abstract License Flag
- Disallowed