書誌事項
- タイトル別名
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- Effects of High Frequency Electromagnetic Fields on DNA Damage using the Comet Assay Method
- コメットアッセイホウ オ モチイタ コウシュウハ デンジカイ バクロ ニ ヨル DNA ソンショウ カイセキ
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We investigated whether exposure to high frequency electromagnetic fields causes DNA damage in cells, using the alkaline Comet assay. The exposure device made for this study used a TE01 circular waveguide operating at a frequency of 2.45GHz. Cells of the human brain tumor-derived MO54 cell line were exposed to an electromagnetic field (input power: 7.8W, average SAR in the middle well of an annular culture plate: CW 50W/kg) for 2 hours & the tail moments of the cells in the inner, middle & outer wells of the plate were compared with those of sham-exposed cells. There was no significant difference between the high frequency electromagnetic field-exposed groups & the sham-exposed groups. Three studies performed under the same conditions gave similar results. Next, cells were exposed to a stronger electromagnetic field (input power: 13W, average SAR in the middle well: CW 100W/kg) for 2 hours & compared with sham-exposed cells. There was also no significant difference in the tail moments of cells in the inner, middle & outer wells of the plate in the high frequency electromagnetic field-exposed groups and the sham-exposed groups. These findings suggest that a high frequency electromagnetic field does not cause direct DNA damage, & does not induce DNA strand breaks, even at a SAR of 100 W/kg.
収録刊行物
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- 電気学会論文誌. A
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電気学会論文誌. A 121 (12), 1093-1098, 2001
一般社団法人 電気学会
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詳細情報 詳細情報について
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- CRID
- 1390001204599381632
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- NII論文ID
- 130006839182
- 10007452470
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- NII書誌ID
- AN10136312
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- ISSN
- 13475533
- 03854205
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- NDL書誌ID
- 5994209
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