Artifact Tolerance Test for Capacitive Wearable Chest-Belt Electrocardiograph
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- Kato Yuki
- Graduate School of Engineering, Tokyo Denki University
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- Motohara Shosaku
- Graduate School of Engineering, Tokyo Denki University
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- Takao Ohmuta
- School of Medical Engineering, Suzuka University of Medical Science
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- Azhim Azran
- Department of Biotechnology, Kulliyyah of Science, International Islamic University Malaysia
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- Ueno Akinori
- Graduate School of Engineering, Tokyo Denki University
Bibliographic Information
- Other Title
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- 容量式ウェアラブル胸バンド型心電計における外乱に対する耐性評価
- 容量式ウェアラブル胸バンド型心電計における外乱に対する耐性評価 : 電極シールド構造の影響
- ヨウリョウシキ ウェアラブル キョウ バンドガタ シンデンケイ ニ オケル ガイラン ニ タイスル タイセイ ヒョウカ : デンキョク シールド コウゾウ ノ エイキョウ
- —電極シールド構造の影響—
- —Effect of Electrode Configuration—
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Abstract
<p>Electrocardiogram (ECG) provides useful information for the diagnosis of cardiovascular disease. In capacitive-coupled ECG sensing, electrostatic artifact and movement artifact become serious problems. In particular, low frequency components such as T wave of ECG are susceptible to the artifacts. To obtain clear ECG, high stability is required for the electrocardiograph using capacitive-coupled electrode. In this study, tolerance of capacitive wearable chest-belt electrocardiograph was tested for the electrostatic and movement artifacts. A constant electrostatic artifact was discharged repeatedly on three types of electrode having different shielding configurations, and their transient responses were compared in terms of deviation area, transient slope and recovery time. The results revealed the best tolerance of doubly-shielded five-layered electrode. The best performed five-layered electrode was used for exercise tolerance test. Then, detection rates of R-wave and T-wave of ECG, and standard deviation of base line of the recordings were calculated as tolerance indices and compared to those obtained by commercial disposable electrode. Although R-wave detection rate of the five-layered electrode decreased by 2.0%, the rate of T-wave was comparable to those of the disposable electrode. Furthermore, the standard deviation of the base line was significantly smaller than that of the disposable electrode (p<0.01).</p>
Journal
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- IEEJ Transactions on Electronics, Information and Systems
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IEEJ Transactions on Electronics, Information and Systems 137 (4), 607-615, 2017
The Institute of Electrical Engineers of Japan
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Keywords
Details 詳細情報について
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- CRID
- 1390001204607978880
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- NII Article ID
- 130005530156
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- NII Book ID
- AN10065950
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- ISSN
- 13488155
- 03854221
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- NDL BIB ID
- 028149962
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed