An evaluation method for SO<sub>2</sub> test of preset potentiometers by using 1/f noise
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- Yoshida Hiromichi
- Tokyo Metropolitan Industrial Technology Center
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- Mikami Kazumasa
- Tokyo Metropolitan Industrial Technology Center
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- Takahashi Kotaro
- Sumida Technology Center for Small and Medium-sized Enterprises
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- Kawaguchi Takahiro
- Tokyo Metropolitan Industrial Technology Center
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- Sagawa Masahiko
- Tokyo Metropolitan University
Bibliographic Information
- Other Title
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- 1/fノイズを利用した半固定抵抗器のSO<sub>2</sub>試験評価方法
Journal
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- IEEJ Transactions on Electronics, Information and Systems
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IEEJ Transactions on Electronics, Information and Systems 116 (12), 1416-1417, 1996
The Institute of Electrical Engineers of Japan
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Keywords
Details 詳細情報について
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- CRID
- 1390001204608208384
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- NII Article ID
- 130006843993
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- ISSN
- 13488155
- 03854221
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- Data Source
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- JaLC
- Crossref
- CiNii Articles