Design Method for Stacked FeRAM with Oxide-Channel Transistor
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- Sugano Koichi
- Graduation School of Electrical and Information Engineering, Shonan Institute of Technology
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- Watanabe Shigeyoshi
- Department of Information Science, Shonan Insutitute of Technology
Bibliographic Information
- Other Title
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- 酸化物導電膜チャネルを用いた積層型FeRAMの設計法
- サンカブツ ドウデン マク チャネル オ モチイタ セキソウガタ FeRAM ノ セッケイホウ
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Abstract
Design method for stacked FeRAM with oxide-channel transistor has been newly proposed. Using this architecture without sacrificing the reliability of the ferro-electric thin film, both high-speed competitive DRAM and low-cost more than 1 layered Flash memory can be successfully realized. For the case of µ=20cm2/vs stacked NAND structure is available. For the case of µ=0.2cm2/vs stacked NOR structure is effective.
Journal
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- IEEJ Transactions on Electronics, Information and Systems
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IEEJ Transactions on Electronics, Information and Systems 131 (4), 810-817, 2011
The Institute of Electrical Engineers of Japan
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Details 詳細情報について
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- CRID
- 1390001204608842496
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- NII Article ID
- 10027979910
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- NII Book ID
- AN10065950
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- ISSN
- 13488155
- 03854221
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- NDL BIB ID
- 11065279
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed