Characteristics of Creeping Discharge Developed in Narrow Gap between Insulators and Effect of a Backside Electrode
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- Nishikawa Tetsuji
- Department of Electrical, Electronic and Computer Engineering Graduate School of Engineering, Himeji Institute of Technology
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- Sakamoto Naoki
- Department of Electrical, Electronic and Computer Engineering Graduate School of Engineering, Himeji Institute of Technology
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- Ueno Hideki
- Department of Electrical, Electronic and Computer Engineering Graduate School of Engineering, Himeji Institute of Technology
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- Nakayama Hiroshi
- Department of Electrical, Electronic and Computer Engineering Graduate School of Engineering, Himeji Institute of Technology
Bibliographic Information
- Other Title
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- μsパルス電圧波頭部における絶縁物微小間隙を貫く沿面放電と背後電極の影響
- マイクロs パルス デンアツ ハトウブ ニ オケル ゼツエンブツ ビショウ カンゲキ オ ツラヌク エンメン ホウデン ト ハイゴ デンキョク ノ エイキョウ
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Abstract
Discharge characteristics have been investigated for a needle-plane electrode configuration containing insulating barriers with a narrow gap which has been placed between the needle and the plane. Characteristics of creeping discharge developed in the narrow gap of the barrier filled with SF6 have been focusd. In the case of a configuration with a backside electrode below the needle, corona generated from the needle has easily extended to the gap. On theother hand, for the case of configuration without backside electrode, the corona has hardly extended to the gap, and then by increasing applied voltage the corona has greatly developed in the gap. This difference on the corona extension should affect to the flashover characteristics in the present system.
Journal
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- IEEJ Transactions on Electronics, Information and Systems
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IEEJ Transactions on Electronics, Information and Systems 122 (11), 1894-1901, 2002
The Institute of Electrical Engineers of Japan
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Details 詳細情報について
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- CRID
- 1390001204611192704
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- NII Article ID
- 130006845895
- 10010454254
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- NII Book ID
- AN10065950
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- ISSN
- 13488155
- 03854221
- http://id.crossref.org/issn/03854221
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- NDL BIB ID
- 6345346
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed