書誌事項
- タイトル別名
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- Application of CW Laser Crystallization for Display Devices.
説明
High-performance poly-Si TFTs were created using the diode pumped solid-state (DPSS) continuous-wave (CW) laser lateral crystallization (CLC) method through fabrication processes at no higher than 450 °C. With decreasing Si film thickness, the grain size became finer and the surface orientation of the grains changed from (100) to other orientations. These effects reduced the field-effect mobility as the Si film became thinner, but with the CLC method we can still obtain a high field-effect mobility of over 300 cm2/Vs without applying special processing techniques, even from a Si film as thin as 50 nm. We expect this crystallization method to lead to the fabrication of high-performance Si-LSI circuits on large non-alkaline glass substrates.
収録刊行物
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- レーザー研究
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レーザー研究 31 (1), 50-56, 2003
一般社団法人 レーザー学会
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詳細情報 詳細情報について
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- CRID
- 1390001204647139712
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- NII論文ID
- 130004465375
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- COI
- 1:CAS:528:DC%2BD3sXisVWmsLc%3D
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- ISSN
- 13496603
- 03870200
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- Crossref
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- 抄録ライセンスフラグ
- 使用不可