書誌事項
- タイトル別名
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- VHF Conducted Emission Simulation of Power Electronic Devices
- パワーエレクトロニクス キキ ノ VHFタイ デンドウ エミッション ノ シミュレーション
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This paper provides a new method to estimate very high frequency (VHF) conducted noise from power electronic devices using numerical analysis. The switching waveforms generated by power semiconductor devices, which are the main noise sources, are calculated by a circuit simulation that uses semiconductor device models. The transfer functions from noise sources to voltage measurement points are calculated by the S-parameters on a power electronic device. The S-parameters are calculated by a 3D electromagnetic simulator. The combined results of circuit simulation and electromagnetic analysis create a good correlation with the actual experimental result in the frequency range of 200MHz and below.
収録刊行物
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- 電気学会論文誌Ｄ（産業応用部門誌）
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電気学会論文誌Ｄ（産業応用部門誌） 133 (5), 510-517, 2013
一般社団法人 電気学会
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詳細情報 詳細情報について
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- CRID
- 1390001204658380800
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- NII論文ID
- 10031166997
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- NII書誌ID
- AN10012320
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- ISSN
- 13488163
- 09136339
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- NDL書誌ID
- 024670073
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
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- 抄録ライセンスフラグ
- 使用不可