A Sample Preparation Method for Paper Cross-Sections using a Focused Ion Beam.

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  • 紙の断面試料作製法
  • カミ ノ ダンメン シリョウ サクセイホウ

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Abstract

A new preparation technique of cross-section for examining the fine structure of fiber and paper was investigated. A critical point in the structural characterization study of paper is to prepare cross-sections in a way the structure remains unchanged. However, the destruction of internal structure or creation of artifact in the thin sections during their preparation process even in a epoxy resin embedded sample is not avoidable. A focused ion beam (FIB) technique was applied as an improved method for a variety of papers. This technique has specially been used for fine processing of semiconductor or metals. Advantageous points of this method are as follows; (1) Sample temperature during the beam cutting is kept lower than 40°C, (2) Any optional area can be selected for sectioning, (3) A two step irradiation method is applicable for anisotropic composite materials. As a result, smooth cross-sections of a woodfree compressible paper and a double coated paper composed of materials with different hardness were successfully prepared and the micrographs with no structural change or artifact was satisfactory obtained. Further, a clear observation of printed ink transferred to paper was realized for the first time by this method.

Journal

  • Sen'i Gakkaishi

    Sen'i Gakkaishi 54 (7), 360-366, 1998

    The Society of Fiber Science and Technology, Japan

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