Study of the In-Plane Crystallographic Structure and Coercivity of CoCrTaPt Thin-Film Magnetic Recording Media
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- Teranishi H.
- Fuji Electric Corp. R & D Ltd.
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- Hirise T.
- Fuji Electric Corp. R & D Ltd.
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- Ohsawa M.
- Fuji Electric Corp. R & D Ltd.
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- Ishiwata O.
- Fuji Electric Corp. R & D Ltd.
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- Ataka T.
- Fuji Electric Corp. Ltd.
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- Ozawa K.
- Fuji Electric Corp. Ltd.
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- Komiya S.
- Fujitsu Lab. Ltd.
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- Iida A.
- National Lab. for High-Energy Physics
Bibliographic Information
- Other Title
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- CoCrTaPt 薄膜磁気記録媒体の面内の結晶学的構造と保磁力
- CoCrTaPt ハクマク ジキ キロク バイタイ ノ メンナイ ノ ケッショ
- CoCrTaPt薄膜磁気記録媒体の面内の結晶学的構造と保磁力 (<特集>磁気記録媒体)
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Abstract
CoCrTaPt/Cr thin-film magnetic recording media were prepared by dc magnetron sputtering onto circum-ferentially textured NiP/Al substrates at various substrate temperatures and substrate bias voltages. The in-plane crystallographic structure analyzed by laboratory X-ray diffraction and grazing iwas ncidence X-ray diffraction using synchrotron radiation, and the correlation between the in-plane crystallographic structure and coercivity was studied. The coercivity was found to depend on both the in-plane c-axis population and strain. This suggests that both magnetocrystalline anisotropy and the inverse mag-netostrictive effect govern the coercivity and magnetic anisotropy. However, the in-plane crystallite size of a Co alloy layer was the same for any deposition parameters.
Journal
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- Journal of the Magnetics Society of Japan
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Journal of the Magnetics Society of Japan 21 (4_2), 209-212, 1997
The Magnetics Society of Japan
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Keywords
Details 詳細情報について
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- CRID
- 1390001205092839168
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- NII Article ID
- 110002809847
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- NII Book ID
- AN0031390X
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- ISSN
- 18804004
- 02850192
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- NDL BIB ID
- 4192899
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- Data Source
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- JaLC
- NDL
- Crossref
- NDL-Digital
- CiNii Articles
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- Abstract License Flag
- Disallowed