Tristable Switching in AFS FLCs (Anti-Ferroelectricity Stabilized Ferroelectric Liquid Crystals)
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- Itoh Keizou
- Department of Organic and Polymeric Materials, Tokyo Institute of Technology On leave from Kashima Oil Co. Ltd., R & D Department
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- Johno Masahiro
- Department of Organic and Polymeric Materials, Tokyo Institute of Technology On leave from Mitsubishi Gas Chemical Co. Inc., Central Lab.
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- Chandani A. D. L.
- Department of Organic and Polymeric Materials, Tokyo Institute of Technology
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- Lee Ji
- Department of Organic and Polymeric Materials, Tokyo Institute of Technology
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- Ouchi Yukio
- Department of Organic and Polymeric Materials, Tokyo Institute of Technology
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- Takezoe Hideo
- Department of Organic and Polymeric Materials, Tokyo Institute of Technology
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- Fukuda Atsuo
- Department of Organic and Polymeric Materials, Tokyo Institute of Technology
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- Kitazume Tomoya
- Department of Bioengineering, Tokyo Institute of Technology
Bibliographic Information
- Other Title
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- 反強誘電性安定化 (AFS) 強誘電性液晶 (FLC) における3安定状態間スイッチング
- ハン キョウ ユウデンセイ アンテイカ AFS キョウユウデンセイ エキショウ
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Abstract
A new concept of antiferroelectric stabilization as a result of intermolecular interaction is presented. The characteristic features of the tristable switching among the electric-field-unwound, tilted uniform states and the so-called 3rd state in the antiferroelectricity stabilized ferroelectric liquid crystals (AFS FLCs) are discussed : 1) The director is parallel to the smectic layer normal in the most stable 3rd state and the alignment is easily attained and well maintained : 2) Because of the absence of permanent spontaneous polarization, the switching is free from the so-called ghost effect, one of the serious problems in SS FLCs : 3) Sharp DC threshold and hysteresis endow the switching with the memory effect : 4) Response time sensitively depends on the applied voltage and may become sufficiently fast : 5) The soft smectic layer assures the quasi-bookshelf layer structure and hence the relatively high contrast ratio : and 6) Regular formation of domains may allow us to attain the gray scale. Since the number of FLC materials showing AFS is increasing, it is worth while to investigate its application to displays and other electro-optic devices.
Journal
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- The Journal of the Institute of Television Engineers of Japan
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The Journal of the Institute of Television Engineers of Japan 44 (5), 536-543_1, 1990
The Institute of Image Information and Television Engineers
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Details 詳細情報について
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- CRID
- 1390001205097501824
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- NII Article ID
- 110003702766
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- NII Book ID
- AN00151466
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- ISSN
- 18849652
- 03866831
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- NDL BIB ID
- 3666184
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed