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- Ishii Junko
- Graduate School of Life Science and Systems Engineering, Kyushu Institute of Technology National Institute of Technology, Kitakyushu College
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- Miyawaki Yasuhiro
- Graduate School of Life Science and Systems Engineering, Kyushu Institute of Technology
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- Tsuboi Naoya
- Graduate School of Life Science and Systems Engineering, Kyushu Institute of Technology
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- Ikari Tomonori
- National Institute of Technology, Ube College
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- Naitoh Masamichi
- Graduate School of Life Science and Systems Engineering, Kyushu Institute of Technology
説明
We used scanning tunneling microscopy, X-ray photoelectron spectroscopy, and Raman spectroscopy to investigate the influence of ion-beam irradiation on the growth of graphene on 3C-SiC(111) surfaces via the SiC surface decomposition method. When the SiC(111) surface was irradiated with Ar+ ions, the surface bonds of the SiC(111) surfaces were broken. After annealing the SiC surface with an Ar+-ion beam at an accelerating voltage of 1 keV and an incident angle of 70°, we obtained graphene with few defects. However, in the case of Ar+-ion-beam irradiation at 60°, the resulting graphene layers exhibited high defect concentrations. We observed that the Si defect and breakage of bonds in the surface region promotes the formation of graphene layers and that the destruction of the deep layers of SiC substrate prevents the growth of graphene. [DOI: 10.1380/ejssnt.2016.121]
収録刊行物
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- e-Journal of Surface Science and Nanotechnology
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e-Journal of Surface Science and Nanotechnology 14 (0), 121-124, 2016
公益社団法人 日本表面真空学会
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キーワード
詳細情報 詳細情報について
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- CRID
- 1390001205185089920
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- NII論文ID
- 130005144149
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- ISSN
- 13480391
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
- OpenAIRE
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- 抄録ライセンスフラグ
- 使用不可