Erratum: Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation [IEICE Electronics Express Vol. 13 (2016) No. 17 pp. 20160627]
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- Khan Saqib A.
- Department of Elec. & Comm. Engineering, Hanyang University
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- Wen Shi-Jie
- Component Engineering Group, Cisco System Inc.
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- Baeg Sanghyeon
- Department of Elec. & Comm. Engineering, Hanyang University
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- IEICE Electronics Express
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IEICE Electronics Express 13 (19), 20168001-20168001, 2016
一般社団法人 電子情報通信学会
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