Diffusion Profile Measurement Using SIMS in La<sub>0.9</sub>Sr<sub>0.1</sub>FeO<sub>3</sub> and La<sub>0.9</sub>Sr<sub>0.1</sub>CoO<sub>3</sub>
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- ISHIGAKI Takamasa
- National Institute for Research in Inorganic Materials
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- YAMAUCHI Shigeru
- National Rehabilitation Center for the Disabled
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- FUEKI Kazuo
- Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo
Bibliographic Information
- Other Title
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- SIMSによるLa<sub>0.9</sub>Sr<sub>0.1</sub>FeO<sub>3</sub>, La<sub>0.9</sub>Sr<sub>0.1</sub>CoO<sub>3</sub>中の拡散プロファイルの測定
- SIMS ニ ヨル La0.9Sr0.1FeO3 La0.9Sr0.1CoO3
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Abstract
The diffusion profiles of 18O in La0.9Sr0.1FeO3 and La0.9Sr0.1CoO3 were measured with a secondary ion mass spectrometer. The gas-solid oxygen isotopic exchange reaction was strongly limited by a surface reaction. The depth profile data were carefully treated and the tracer diffusion coefficient of oxide ions in the oxides was determined successfully.
Journal
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- Journal of the Ceramic Association, Japan
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Journal of the Ceramic Association, Japan 95 (1106), 1031-1033, 1987
The Ceramic Society of Japan
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Keywords
Details 詳細情報について
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- CRID
- 1390001205248966272
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- NII Article ID
- 110002313731
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- NII Book ID
- AN00245650
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- ISSN
- 18842127
- 00090255
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- NDL BIB ID
- 3156373
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed
