Crystallographic Orientation Measurement in Alumina Using Raman-Microprobe Polarization.

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  • ラマン分光法による多結晶アルミナの結晶方位の測定

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Abstract

The crystallographic orientations of individual grains in translucent alumina were successfully determined using polarized Raman spectroscopy. The following results were obtained.<br>(1) Raman tensor elements of sapphire, a and b, belonging to the A1g mode were obtained and it was revealed that a<<b for 645cm-1 line. Consequently, the polarized Raman intensity is given by cosφ.<br>(2) Projection angles of the c-axis of individual alumina grains were determined by the polarized Raman peak of 645cm-1 line which belongs to the A1g mode. In the special case of constant Raman intensity for sample rotation, the c-axis was perpendicular to the measured plane.<br>(3) Adjoining grains in translucent alumina were found to have different crystal orientations. These were experimentally determined in this study.

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