Development of Optical Fiber built-in Type Kelvin Probe —Development of Band Diagram Measurement System—

DOI Web Site 7 References
  • YAGYU Shinjiro
    International Center for Materials Nanoarchitectonics (WPI-MANA), National Institute for Materials Science (NIMS)
  • YOSHITAKE Michiko
    International Center for Materials Nanoarchitectonics (WPI-MANA), National Institute for Materials Science (NIMS)
  • CHIKYOW Toyohiro
    International Center for Materials Nanoarchitectonics (WPI-MANA), National Institute for Materials Science (NIMS)

Bibliographic Information

Other Title
  • 光ファイバー内蔵型ケルビンプローブの開発　—バンドダイアグラム測定装置の開発—
  • 光ファイバー内蔵型ケルビンプローブの開発 : バンドダイアグラム測定装置の開発
  • ヒカリファイバー ナイゾウガタ ケルビンプローブ ノ カイハツ : バンドダイアグラム ソクテイ ソウチ ノ カイハツ
  • Development of Optical Fiber built-in Type Kelvin Probe —Development of Band Diagram Measurement System—

Search this article

Abstract

  We developed the optical fiber built-in type Kelvin probe, which was combined with the previously developed system. This system can be applied to measure band diagram included fermi level of organic/inorganic semiconductor, and photovoltage. This system is also applied to the wide range environment from ultra-high vacuum to the atmosphere. We demonstrated photovoltage measurement of polycrystalline Si solar cell. Obtained photovoltage was increasing with increasing photon power. As photovoltage is associated with open-circuit voltage, the obtained results are consistent with its trend. This system has a very wide range of applications ranging from band gap science and solar cell evaluation.<br>

Journal

References(7)*help

See more

Keywords

Details 詳細情報について

Report a problem

Back to top