Analysis of Atomic Oxygen Fluence Distribution on Satellite Surface
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- IWATA Minoru
- Kyushu Institute of Technology
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- OGAWA Toshiaki
- NEC Corporation
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- KOBAYASHI Hiroaki
- I-NET Corporation
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- CHO Mengu
- Kyushu Institute of Technology
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- KIM Jeong-ho
- MUSCAT Space Engineering Co. Ltd.
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- HATTA Shinji
- MUSCAT Space Engineering Co. Ltd.
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- MIHARA Shoichiro
- Japan Space Systems
説明
The atomic oxygen (AO) in low Earth orbit erodes spacecraft materials. Since the organic materials are significantly damaged by AO, we must evaluate the erosion effects during satellite missions before launch. The first step in evaluating the erosion effect due to AO is to determine the distribution of AO fluence and/or flux on the entire satellite surface during the satellite mission. The AO fluence on the satellite surface is different for different parts of the satellite surface because the ram surface receives AO changes according to the satellite attitude in orbit. Therefore, AO fluence must be estimated by considering the satellite attitude, shape, ram direction and AO density in orbit. However, there are no studies in which the AO fluence distribution is estimated for the entire satellite surface. In addition, there is no tool to analyze AO fluence distribution on the satellite surface. Thus, in this study, we construct an AO fluence distribution analysis tool and estimate the AO fluence distribution on the entire satellite surface.
収録刊行物
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- TRANSACTIONS OF THE JAPAN SOCIETY FOR AERONAUTICAL AND SPACE SCIENCES, AEROSPACE TECHNOLOGY JAPAN
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TRANSACTIONS OF THE JAPAN SOCIETY FOR AERONAUTICAL AND SPACE SCIENCES, AEROSPACE TECHNOLOGY JAPAN 10 (0), 5-9, 2012
一般社団法人 日本航空宇宙学会
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詳細情報 詳細情報について
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- CRID
- 1390001205321019648
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- NII論文ID
- 130002142930
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- ISSN
- 18840485
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- HANDLE
- 10228/00007629
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- IRDB
- Crossref
- CiNii Articles
- OpenAIRE
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- 抄録ライセンスフラグ
- 使用不可