Absolute Configuration Analysis of Organic Compounds by Single Crystal X-ray Diffraction

DOI Web Site Web Site 17 References

Bibliographic Information

Other Title
  • 単結晶X線回折と有機化合物の絶対配置決定
  • ラウンジ 単結晶X線回折と有機化合物の絶対配置決定
  • ラウンジ タンケッショウ Xセン カイセツ ト ユウキ カゴウブツ ノ ゼッタイ ハイチ ケッテイ

Search this article

Abstract

Thanks to the development of automation systems and programs for single crystal X-ray diffraction analysis, X-ray structure analysis have become a familiar technic for organic chemists to obtain structural information. However, determination of the absolute configuration of organic compounds only including light-atom (C, H, N, O) by X-ray diffraction have been a difficult topic due to the weak resonant scattering from light atoms. The main purpose of this review is to introduce recent developments of absolute structure determination method by X-ray structure analysis. New algorisms, such as Hooft parameter and Parsons parameter, make it possible to determine the absolute configuration of organic compound by typical X-ray diffractometer without any special equipment.

Journal

References(17)*help

See more

Related Projects

See more

Keywords

Details 詳細情報について

Report a problem

Back to top