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- TANAKA Kichinosuke
- Kyoto University
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- NAKASHIMA Minoru
- Kyoto University
Bibliographic Information
- Other Title
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- Photograting 法による実験的ひずみ解析方法
- Photogratingホウ ニ ヨル ジッケンテキヒズミ カイセキ ホウホウ
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Description
Previously, the authors reported results obtained through the usual method of experimental strain analysis by photograting, applying the method to two-dimensional problems (using experimental values of interference fringe spacing and inclination), and also suggested a new method of experimental strain analysis by photograting. In the new method, the inclinations of two interference fringe patterns with the reference axis ∅+ and ∅-, where the master screen axis makes the angle +θ and -θ respectively with the reference axis, are used.<br>In this paper, two methods of experimental strain analysis by photograting are presented and the accuracy of strain measurement by the new method is described and discussed.<br>It has been clarified that the new method makes strain measurement easier and helps to improve the accuracy of measurement. It was also concluded that the angle θ should be 2° for strains less than 1% and 3° for about 1% strain and with increasing strain greater θ's must be adopted to get high accuracy.
Journal
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- journal of the Japan Society for Testing Materials
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journal of the Japan Society for Testing Materials 10 (89), 116-121, 1961
The Society of Materials Science, Japan
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Details 詳細情報について
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- CRID
- 1390001205367431680
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- NII Article ID
- 130003928887
- 110002286547
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- NII Book ID
- AN00096222
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- NDL BIB ID
- 9058938
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- ISSN
- 03727971
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL Search
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed