Application of Multiple-Image Fourier Transform Spectral Imaging to Measurement of Fast Phenomena

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  • HIRAI Akiko
    Department of Applied Physics, Faculty of Engineering, Osaka University, 2–1, Yamada–oka, Suita, Osaka, 565 Japan
  • INOUE Takashi
    Department of Applied Physics, Faculty of Engineering, Osaka University, 2–1, Yamada–oka, Suita, Osaka, 565 Japan
  • ITOH Kazuyoshi
    Department of Applied Physics, Faculty of Engineering, Osaka University, 2–1, Yamada–oka, Suita, Osaka, 565 Japan
  • ICHIOKA Yoshiki
    Department of Applied Physics, Faculty of Engineering, Osaka University, 2–1, Yamada–oka, Suita, Osaka, 565 Japan

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Other Title
  • Application of Measurement multiple-image fourier of fast phenomena transform spectral imaging to measurement of fast phenomena

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Description

A new interferometric technique that simultaneously acquires all optical data necessary to reconstruct a spectral image is proposed. The optical data is a two-dimensional array of two-dimensional interference patterns. The data are acquired by an optical system consisting of a two-dimensional lens array and a Michelson interferometer. The interference patterns are generally distorted by the errors in path differences. These errors can be estimated beforehand and corrected in the process of reconstruction of the spectral image. Experimental results obtained with this technique applied to a fast phenomenon are also presented.

Journal

  • Optical Review

    Optical Review 1 (2), 205-207, 1994

    Japan Society of Applied Physics

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