Effect of mechanical properties of underfill material on the local deformation of a silicon chip mounted on area-arrayed fine bumps
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- Nakahira Kohta
- Tohoku Univ.
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- Kishi Hiroki
- Tohoku Univ.
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- Suzuki Ken
- Tohoku Univ.
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- Miura Hideo
- Tohoku Univ.
Bibliographic Information
- Other Title
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- エリアアレイバンプ実装チップの局所変形に及ぼすアンダーフィル材質の影響
Description
Local deformation of silicon chips mounted on area-arrayed fine metallic bumps has increased drastically in mobile application because of the thinning of the chips. Since such local deformation increases the amplitude of the local residual stress in the chips, the reliability of the chips is degraded seriously. In this study, the effect of the mechanical properties of underfill material on the local deformation was measured by using stress-sensing chips. It was found that the dominant factors of the local deformation changed drastically as a function of the bump pitch.
Journal
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- Proceedings of JIEP Annual Meeting
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Proceedings of JIEP Annual Meeting 24 (0), 40-41, 2010
The Japan Institute of Electronics Packaging
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Details 詳細情報について
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- CRID
- 1390001205556161152
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- NII Article ID
- 130005469608
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- Text Lang
- ja
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- Data Source
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- JaLC
- CiNii Articles
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- Abstract License Flag
- Disallowed