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- NAKADA Masayuki
- Gunma University
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- AMAGAI Kennji
- Gunma University
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- 大久保 勇佑
- 群大理工
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- FUKUNAGA Akira
- EBARA Corporation
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- HIYAMA Hirokuni
- EBARA Corporation
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- HAMADA Satomi
- EBARA Corporation
Bibliographic Information
- Other Title
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- 10111 様々な膜種の半導体ウェーハに付着した液滴の蒸発モデル
Description
The droplet evaporation process was categorized into two types, i.e. constant contact radius (CCR) and constant contact angle (CCA) types. The present study was aimed to construct the mathematical model to describe the droplet evaporation phenomena for CCR and CCA types. The mathematical model was developed by considering evaporation phenomena at the droplet edge. The change of droplet volumes predicted by the mathematical model were compared with the experimental data of droplet evaporation of Cu, Low-k, and Th-Ox wafers. As a result, it was confirmed that the result of developed model was in agreement with the experimental data.
Journal
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- The Proceedings of Conference of Kanto Branch
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The Proceedings of Conference of Kanto Branch 2015.21 (0), _10111-1_-_10111-2_, 2015
The Japan Society of Mechanical Engineers
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Keywords
Details 詳細情報について
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- CRID
- 1390001205846737536
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- NII Article ID
- 110009948151
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- ISSN
- 24242691
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- Text Lang
- ja
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- Data Source
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- JaLC
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed