Dislocation-free CZ-Si Crystal Growth without Thin Neck(<Special Issue>Science and Technology in Crystal Growth)
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- Hoshikawa Keigo
- Faculty of Education, Shinshu University
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- Taishi Toshinori
- Faculty of Education, Shinshu University
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- Huang Xinming
- Silicon Technology Corp.
Bibliographic Information
- Other Title
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- 細いネック部を形成しない無転位CZ-Si結晶成長(<小特集>バルク成長分科会特集 : 結晶成長の科学と技術)
- 解説 細いネック部を形成しない無転位CZ-Si結晶成長
- カイセツ ホソイ ネックブ オ ケイセイ シナイ ムテンイ CZ Si ケッショウ セイチョウ
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Description
It is found that dislocation-free silicon crystal growth is possible without a thin neck proposed by Dash at 40 years ago and established as the critical step to obtain dislocation-free silicon crystal. Three kind of dislocations which are formed due to thermal shock, lattice misfit and incomplete seeding must be suppressed to grow dislocation-free crystals without the thin neck. It is shown that seed crystals heavily doped with B, Ge or In are useful to suppress dislocation generation due to thermal shock and seed crystals codoped with B and Ge are useful to suppress dislocation generation due to lattice misfit. The seeding conditions such as temperature and pulling rate which result in a shape of crystal grown are discussed to avoid dis-location formation due to incomplete seeding. Finally, industrial scale silicon crystals with 8 inches in diameter are successfully grown without the thin neck.
Journal
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- Journal of the Japanese Association for Crystal Growth
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Journal of the Japanese Association for Crystal Growth 29 (5), 413-422, 2002
The Japanese Association for Crystal Growth
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Details 詳細情報について
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- CRID
- 1390001205897559040
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- NII Article ID
- 110002715707
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- NII Book ID
- AN00188386
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- ISSN
- 21878366
- 03856275
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- NDL BIB ID
- 6433451
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL Search
- CiNii Articles
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- Abstract License Flag
- Disallowed